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Nspm-6800Th |
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System Introduction |
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This machine works in conjunction with NSPM-6800 to measure changes in temperature, thermal conductivity and micro-zone heating. Measurements can be made as low and high dielectric coefficient of thermal conductivity. The unique way of measuring coefficient of thermal conductivity allows the thermal scanning microscope does not require being in contact with the sample surface. The non-destructive method allows for better resolution. |
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Features |
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 Uses NSPM-6800 to measure and analysis thermal functions |
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Measure Thermal Conductivity Coefficient |
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Heat can be applied directly onto the samples in scanning platform |
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Technical Parameters |
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| Scan Range |
30µm X 30µm |
| Scanning Platform Size |
20mm X 20 mm |
| Temperature Resolution |
1℃ |
| Heat Probe Radius Curvature |
5μm |
| Heat Probe Material |
Pt/Rh |
| Temperature Range |
0℃∼400℃ |
| Rate of Temperature Rise |
1500℃/min |
| Probe Heating Mode |
Conductivity Contrast Mode Temperature Contrast Mode |
| Temperature |
20℃∼30℃ ±2℃/hour following |
| Humidity |
20∼70% |
| Power |
AC220 ±10V |
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